In this study, a SiO₂-Na₂O-K₂O-CaO-Al₂O₃ glass system was prepared via the sol-gel method, and its densification, microstructure, and dielectric properties of different ratios were investigated. The main focus of the present work is to investigate the potential usage of SiO₂-Na₂O-K₂O-CaO-Al₂O₃ glass systems in fifth-generation communications (5G). From the differential thermal analysis - thermogravimetric analysis (DTA-TG) results, 65SiO₂-15.75Na₂O-5.75K₂O-5.75CaO-7.75Al₂O₃ glass showed four endothermic peaks (corresponding to thermal decomposition of Ca(NO₃)₂?4H₂O, Al(NO₃)₃?9H₂O, NaNO₃, and KNO₃) and three exothermic peaks (corresponding to crystallization of SiO₂, CaAl₂Si₂O₅, and Na₂CaSiO₄) in the temperature range from 30°C to 1000°C. The thermogravimetric loss of the as-prepared sample was found to be 51.8 %, mainly originating from the loss of nitrate, water, and ethanol molecules. Further, the exothermic and endothermic peaks were shifted to higher temperatures with increasing content of SiO₂, and the peaks shifted toward lower temperatures with decreasing content of SiO₂. Dilatometer (DIL) results showed that 65SiO₂-15.75Na₂O-5.75K₂O-5.75CaO-7.75Al₂O₃ glass has a Ts (soften point) of 471.3°C, and when the content of SiO₂ reached to 70 wt%, the Ts was increased to 497.1°C. The X-Ray diffraction (XRD) pattern confirms that glass systems are free from the impurity crystalline phases. The glass system has 65 wt% of SiO₂ content can be densified after 30 min. of sintering time at 650°C (ρ = 2.45 g/cm³), and while the glass system has 70 wt% of SiO₂, densified after 60 min. of sintering at 650°C (ρ = 2.46 g/cm³). Scanning electron microscopy (SEM) confirmed that the glass systems densified with the occurrence of small pores in the 65SiO₂-15.75Na₂O-5.75K₂O-5.75CaO-7.75Al₂O₃ and 70SiO₂-14.5Na₂O-4.5K₂O-4.5CaO-6.5Al₂O₃ glasses. The microwave dielectric properties of 65SiO₂-15.75Na₂O-5.75K₂O-5.75CaO-7.75Al₂O₃ glass samples were measured by using a network analyzer in TE mode, which shows excellent microwave dielectric properties at 11.86 GHz (ε_r = 4.3, Q x f = 4570 GHz) and by using an open resonator in the range of 20 GHz to 60 GHz, dielectric properties of 65SiO₂-15.75Na₂O-5.75K₂O-5.75CaO-7.75Al₂O₃ glass with Na₂CaSi₃O₈ phase were found to be ε_r = 6.4 and tanδ = 1.5 × 10^-2 at the frequency of 59.4 GHz.